X-Rite's Redesigned i1Pro 2 Spectrophotometer Receives iF Award
X-Rite, Incorporated has announced that its redesigned i1Pro 2 spectrophotometer has received another international award – the 2013 iF Product Design Award.
Enhanced Optical Brightener Compensation allows for the most accurate profiling (both Tungsten and UV/LED mode) for today’s enhanced range of substrates. Now users can predict what colors printed on optically brightened paper will look like under different light conditions using a single hand-held device.
Positioning Detection Sensor provides a more robust scanning experience even on special substrates and low-resolution printers. It allows for the measurement of smaller patch sizes (as low as 7mm) in manual mode and enables dual measurement workflows for OBC, M1 and M2.
New Wizard-driven interface with status LED leads users through the profiling and calibration process while providing all the options and control desired, regardless of expertise.
New Design Ergonomics throughout allows for greater usability, flexibility, cleaning, protection, and storage of the precision i1Pro 2 device.
Improved Emissive Measurement allows for better temperature stability and higher brightness levels resulting in the best possible calibration and profiling of monitors ever.
All new diagnostics and self-correction features
Wavelength calibration LED allows for self diagnosis of optical grating in relation to sensor during white calibration (with automatic correction and notifications)
Maintaining and protecting the device (and investment) is easier than ever
Self-cleanable aperture protection glass and calibration white tile cover provides additional built-in protection from dust and dirt.
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